Page Summary: Marina Alterman (Technion – Israel Institute of Technology); Evgeniia Saiko (Technion – Israel Institute of Technology); Anat Levin ... PhD Defense - Speckle Patterns for Tailorable & Multiscale Optical Metrology Measurements
Poster 53 Direct Material Acquisition Using Speckle Correlations - Main Context
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Marina Alterman (Technion – Israel Institute of Technology); Evgeniia Saiko (Technion – Israel Institute of Technology); Anat Levin ... PhD Defense - Speckle Patterns for Tailorable & Multiscale Optical Metrology Measurements Wei-Yu Chen (Carnegie Mellon University); Matthew O'Toole (Carnegie Mellon University); Aswin C.
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Updated workflow for optimizing all your calibration parameters based on multiple views of Marc GUILLON, Neurophotonics Laboratory, CNRS, Université Paris Descartes, France. Authors: Marina Alterman ,Chen Bar, Ioannis GKioulekas, and Anat Levin.
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Directory Access Notes about Poster 53 Direct Material Acquisition Using Speckle Correlations.
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- Marina Alterman (Technion – Israel Institute of Technology); Evgeniia Saiko (Technion – Israel Institute of Technology); Anat Levin ...
- PhD Defense - Speckle Patterns for Tailorable & Multiscale Optical Metrology Measurements
- Wei-Yu Chen (Carnegie Mellon University); Matthew O'Toole (Carnegie Mellon University); Aswin C.
- Updated workflow for optimizing all your calibration parameters based on multiple views of
- Marc GUILLON, Neurophotonics Laboratory, CNRS, Université Paris Descartes, France.
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